We're pleased to announce that JKI's PDF Solutions case study has been featured in the Xilinx blog. This article showcases a recent project where we helped our customer develop an fpga-based e-beam wafer instrument that combines a scanning electron microscope (SEM) and optical microscope. This is also very exciting, since JKI recently joined the Xilinx Alliance Program, expanding its capabilities in deliving high-powered fpga-based solutions to its customers.
Read the Xilinx Blog Article Here
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