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SEMICON METROLOGY
 
Automate your wafer manufacturing and inspection systems using JKI's software tools and expert services.
 
 

LET'S WORK TOGETHER

 

| Focus on Your Core IP and Let JKI Handle the Rest

Partner with a company that allows you to focus on developing the unique technology for your application. JKI works with industry leaders by providing software that accelerates development and deployment of semiconductor metrology tools in Fabs and R&D centers across the globe. Our tools allow you to seamlessly integrate with Python, LabVIEW, and .NET.

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Wafer Layout + Alignment
 

Achieve high-precision wafer metrology and inspection by leveraging intuitive wafer layout software and accurate machine vision alignment.

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Automated Wafer Inspection
 

Empower your custom inspection IP with a high-throughput, fully-automated process. Define, execute, and manage test data to run inline during semiconductor manufacturing.

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Fab Integration 

 

Quickly integrate your system into Fabs using standard semiconductor factory automation software and protocols. Do you use PEER Group's PTO™ software? We do too!

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"We value our relationship with JKI because we can count on their highly skilled team to work collaboratively and solve even the toughest challenges. JKI has helped us accelerate our R&D, which has been critical to the successful development of our SEM tool."
Yoram Schwarz
Director of Software Engineering, PDF Solutions

CUSTOMER SUCCESS STORIES

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Next-Generation Scanning Electron Microscope

JKI worked with PDF Solutions to develop the control software for an inspection tool that can rapidly perform wafer metrology and help semicon companies streamline their manufacturing process.

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Non-Destructive Wafer Inspection

Using JKI's tools and services allowed FemtoMetrix to field a fully operational wafer-defect detection system at a production semiconductor fab on a very aggressive schedule.

 
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Seamless Integration with PEER Group's PTO™

PEE Group PTO Integration